Radiation Safety. Amplified.
Join us on Linkedin
Follow us on YouTube
Subscribe to our Blog

Standard detectors - Series A, PD, FD, CAM

Products in category Application Focus
CAM Continuous Air Monitoring Continuous air monitoring and alpha beta counting
A Alpha Series Low background alpha spectroscopy for radiochemistry applications
PD Partially Depleted Series Charged particle spectroscopy/Heavy-Ion spectroscopy
FD Fully Depleted Series Charged particle identification (dE/dx measurements)/Detector telescopes)
AN Annular PIPS Backscattering electron measurements/Electron beam detectors, Angular correlation measurements
SiLi Room Temperature Lithium Drifted Silicon Detectors High Energy charged particle spectroscopy/CE or X-ray spectroscopy

Products in category

Continuous air monitoring and alpha beta counting - Series CAM

Continuous air monitoring and alpha beta counting - Series CAM

The measurement of alpha (and beta) particles from filters associated with continuous air monitors. CANBERRA instruments with integrated CAM PIPS® can be found in the "related product" column

The same device is ideal for measuring filter samples off-line providing excellent alpha beta separation.

CAM-Series: 300 to 2000mm² with minimum 140µm to 500µm active thickness

CAM-SERIES 140 to 300microns
Active Area
mm2
Active Diameter
mm
Diameter housing
mm
FWHM
(keV)
Bias (V) Threshold (keV) Model No.
α β
300 19.5 28.6 36 15 to 24 CAM300AM
33 15 (12*) 70 45 (36*)
450 23.9 32 38 15 to 24 CAM450AM
34 17 (14*) 70 51 (42*)
490 25 33.4 39 15 to 24 CAM490AM
35 18 (15*) 70 54 (45*)
600 27.6 36.1 42 15 to 24 CAM600AM
37 20 (17*) 70 60 (51*)
900 33.9 45.2 45 15 to 24 CAM900AM
39 22 (19*) 70 66 (57*)
1200 39.1 48.8 55 15 to 24 CAM1200AM
45 25 (21*) 70 75 (63*)
1700 46.5 59 70 15 to 24 CAM1700AM
55 30 (25*) 70 90 (75*)
2000 50 65.5 80 15 to 24 CAM2000AM
65 37 (32*) 70 110 (96*)

*The data between brackets are indicated at 1.0 µsec shaping time

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Applications

Alpha Series - Alpha spectroscopy for radiochemistry applications

Alpha Series - Alpha spectroscopy for radiochemistry applications

The A-series is optimized for high-resolution, high sensitivity, and low-background alpha spectroscopy. The thin dead layer of the PIPS® detector provides enhanced resolution with the close detector-source spacing needed for high efficiency. The background count rate for A-series PIPS® detectors is typically less than 0.05 counts/hr/cm² in the energy range of 3 to 8 MeV. Alpha PIPS® detectors have a minimum active thickness of greater than 140 μm which is sufficient for full absorption of alpha particles of up to 15 MeV.

A-Series: 300 to 1200mm² with minimum 140µm active thickness

A-SERIES > 140 microns
Active Area mm² Active Diameter mm Diameter
housing mm
FWHM (keV) Typical background (counts/day) Model No.
α
300 19.5 28.6 17 4 A300-17AM
450 23.9 32 18 6 A450-18AM
600 27.6 36.1 22 (20)* 8 A600-22AM
900 33.9 45.2 25 (23)* 12 A900-25AM
1200 39.1 48.8 32 (30)* 16 A1200-32AM

*The data between brackets are indicated at 1.0 µsec shaping time

Resolution is approximated for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Applications

Partially Depleted Series - Charged particle spectroscopy

Partially Depleted Series - Charged particle spectroscopy

The PD series of PIPS® detectors finds widespread application in charged particle spectroscopy. The PD series is adaptable to a wide variety of physics research and applied physics experiments.

  • Partially-depleted PIPS® detectors are normally supplied with an Axial microdot connector (model number suffix-AM) but can be ordered with other connectors (click here to see available connectors).
  • Detector dead layer < 50nm on all models
  • 100μm
  • 300μm
  • 500μm
  • 1000μm

25 to 1200mm2 with 100μm active thickness

PD-SERIES 100 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
25 5.7 16.7 12 6 18PD25-12-100AM
50 8 16.7 12 6 18PD50-12-100AM
150 13.8 23.6 14 9 27PD150-14-100AM
300 19.5 28.6 16 11 33PD300-16-100AM
450 23.9 32 17 12 36PD450-17-100AM
600 27.6 36.1 22 (21)* 17 51PD600-22-100AM
900 33.9 45.2 27 (26)* 22 66PD900-27-100AM
1200 39.1 48.8 35 (34)* 30 90PD1200-35-100AM

*The data between brackets are indicated at 1.0 µsec shaping time

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Applications

25 to 5000mm2 with 300μm active thickness

PD-SERIES 300 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
25 5.7 16.7 11 5 15PD25-11-300AM
50 8 16.7 11 5 15PD50-11-300AM
150 13.8 23.6 13 8 24PD150-13-300AM
300 19.5 28.6 15 10 30PD300-15-300AM
450 23.9 32 16 11 33PD450-16-300AM
600 27.6 36.1 20 (19)* 15 45PD600-20-300AM
900 33.9 45.2 22 (21)* 19 57PD900-22-300AM
1200 39.1 48.8 25 (23)* 20 60PD1200-25-300AM
2000 50 65.5 40 (32)* 35 95PD2000-40-300AM
3000 61.8 76.2 55 (40)* 50 150PD3000-55-300AM
5000 79.8 94 80 (70)* 75 225PD5000-80-300AM

*The data between brackets are indicated at 1.0 µsec shaping time

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

25 to 5000mm2 with 500μm active thickness

PD-SERIES* 500 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
25 5.7 16.7 10 4 12PD25-10-500AM
50 8 16.7 11 5 15PD50-11-500AM
150 13.8 23.6 12 7 21PD150-12-500AM
300 19.5 28.6 14 9 27PD300-14-500AM
450 23.9 32 15 10 30PD450-15-500AM
600 27.6 36.1 20 15 45PD600-20-500AM
900 33.9 45.2 22 17 51PD900-22-500AM
1200 39.1 48.8 26 21 63PD1200-26-500AM
2000 50 65.5 35 30 90PD2000-35-500AM
3000 61.8 76.2 50 45 135PD3000-50-500AM
5000 79.8 94 75 70 210PD5000-75-500AM

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

* The PD Series in 500μm are equivalent to former B Series

150 and 300 mm2 with 1000μm active thickness

PD-SERIES 1000 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
150 13.8 23.6 14 9 27PD150-14-1000AM
300 19.5 28.6 16 11 33PD300-16-1000AM

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Fully Depleted Series - Charged particle identification (dE/dx)

Fully Depleted Series - Charged particle identification (dE/dx)

The FD series of PIPS® detectors are used in particle identification, detector telescopes and in other de/dx measurements.

  • Resolution is conservatively specified with alpha particles entering through the rear contact which has a dead layer thickness of < 150nm.
  • The resolution through front contact, with a thickness of < 50nm is better.
  • The FD series are normally supplied in a transmission mount with a radial microdot connector (model number suffix-RM).
  • 300
  • 500

50 to 900mm2 with 300µm active thickness

FD-SERIES 300 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
50 8 19.4 14 6 18 FD50-14-300RM
150 13.8 26.1 15 8 24 FD150-15-300RM
300 19.5 31.6 18 11 33 FD300-18-300RM
450 23.9 34.8 18 12 36 FD450-18-300RM
600 27.6 38.4 22 16 48 FD600-22-300RM
900 33.9 50 24 17 51 FD900-24-300RM

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant, using the exit dead layer as irradiation side. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Applications

50 to 900mm2 with 500µm active thickness

FD-SERIES 500 microns
Active Area mm2 Active Diameter
mm
Diameter housing
mm
FWHM (keV) Threshold (keV) Model No.
α β
50 8 19.4 14 6 18 FD50-14-500RM
150 13.8 26.1 15 8 24 FD150-15-500RM
300 19.5 31.6 17 10 30 FD300-17-500RM
450 23.9 34.8 19 14 36 FD450-19-500RM
600 27.6 38.4 22 15 45 FD600-22-500RM
900 33.9 50 24 17 51 FD900-24-500RM

Resolution is given for 241Am, 5.486 MeV alphas, using standard CANBERRA electronics and 0.5 μs shaping time constant, using the exit dead layer as irradiation side. Electronic resolution is approximated by pulser line width (FWHM) or RMS voltmeter.

Applications

Annular PIPS: Series AN

Annular PIPS: Series AN

These detectors have a 4 mm diameter through hole, and are available in RM mounts only. They are available in Partially Depleted (PD) and Fully Depleted (FD) versions which are 300 microns thick.

Active Diameter (mm) Resolution keV (FWHM) Mount Size mm2 Model No.
Inside Outside α β
5.5 19.5 20 15 300 ANFD300-20-300RM
5.5 19.5 18 14 300 ANPD300-18-300RM
Silicon Lithium Si(Li) Detectors

Features

Standard (PIPS<sup>®</sup>) Detectors
  • Ion implanted contacts
  • SiO2 passivated
  • Low leakage current
  • Low noise
  • Thin window
  • Cleanable
  • Bakeable to 100 °C

Description

CANBERRA 's Passivated Implanted Planar Silicon(PIPS®) Detector is a product of modern semiconductor technology. In most applications, this detector replaces silicon surface barrier (SSB) detectors and diffused junction (DJ) detectors, both of which are still made the same way they were made in 1960. The PIPS® detector has a number of advantages over SDB and DJ types:

  1. All junction edges are buried - no epoxy edge sealant is needed or used.
  2. Contacts are ion-implanted to form precise, thin, abrupt junctions for good alpha resolution.
  3. Entrance window is stable and rugged - it can be cleaned readily and reliably.
  4. Leakage current is typically 1/8 to 1/100 of that of SSB and DJ detectors.
  5. Dead layer (window) thickness is less than that of comparable SDB or DJ detectors.
  6. Standard detectors are bakeable to 100 °C - higher for special models.

The PIPS® Detector is fabricated by the planar process using photolithographic techniques for defining device geometries. Proprietary techniques are used to provide precise control of the oxide passivation, and ion implantation is used to form the accurately controlled junctions necessary for low reverse leakage currents and thin entrance windows. The photolithographic technique lends itself to virtually any geometry which fits onto a diameter of 140 mm.

Read more in the full spec sheet by clicking the button below.

 

 

 

PIPS® is a registered trademark of Canberra Industries, Inc.